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Beschreibung
This book will provide readers with a good overview of some of most recent advances in the field of High-Z materials. There will be a good mixture of general chapters in both technology and applications in opto-electronics, X-ray detection and emerging optoelectronics applications. The book will have an in-depth review of the research topics from world-leading specialists in the field.
Material Properties and Characterization Techniques
Material Properties and Characterization Techniques
Details
| Verlag | Springer International Publishing |
| Ersterscheinung | 03. Januar 2024 |
| Maße | 23.5 cm x 15.5 cm |
| Gewicht | 394 Gramm |
| Format | Softcover |
| ISBN-13 | 9783031209574 |
| Seiten | 246 |