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Beschreibung
The reliability of InGaN/GaN light emitting diodes (LEDs) with different emission wavelengths and different geometries was studied. Device performances, like current-voltage characteristics, 1/f noise spectrum, leakage, static resistance, were measured. The devices underwent a 1000-hr constant-current stress test and their optical output degradation rate was examined. The results were explained by cross-related data.
A Reliability Study
Details
| Verlag | LAP LAMBERT Academic Publishing |
| Ersterscheinung | Mai 2011 |
| Maße | 22 cm x 15 cm x 0.6 cm |
| Gewicht | 137 Gramm |
| Format | Softcover |
| ISBN-13 | 9783844395297 |
| Seiten | 80 |
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