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Fundamentals of Electromigration-Aware Integrated Circuit Design

Fundamentals of Electromigration-Aware Integrated Circuit Design

von Jens Lienig, Matthias Thiele und Susann Rothe
Hardcover - 9783031800221
139,09 €
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Beschreibung

The book provides a comprehensive overview of electromigration and its effects on the reliability of electronic circuits. This second edition has been updated to introduce recent advancements in the understanding of the physical process of electromigration, which gives the reader the knowledge for adopting appropriate counter measures. A comprehensive set of options is presented for modifying the present IC design methodology to prevent electromigration. Finally, the authors show how specific effects can be exploited in present and future technologies to reduce electromigration’s negative impact on circuit reliability.

Details

Verlag Springer International Publishing
Ersterscheinung 26. Februar 2025
Maße 23.5 cm x 15.5 cm
Gewicht 479 Gramm
Format Hardcover
ISBN-13 9783031800221
Auflage Second Edition 2025
Seiten 167

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