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Deep Learning for Advanced X-ray Detection and Imaging Applications

Deep Learning for Advanced X-ray Detection and Imaging Applications

Hardcover - 9783031756528
139,09 €
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Beschreibung

This book provides a comprehensive overview of the latest advances in applying Artificial Intelligence (AI) to advanced X-ray imaging, with a particular focus on its medical applications. Readers will discover why AI is set to revolutionize traditional signal processing and image reconstruction with vastly improved performance. The authors illustrate how Machine Learning (ML) and Deep Learning (DL) significantly advance X-ray detection analysis, image reconstruction, and other crucial steps. This book also reveals how these technologies enable photon counting detector-based X-ray Computed Tomography (CT), which has the potential not only to improve current CT images but also enable new clinical applications, such as providing higher spatial resolution, better soft tissue contrast, K-edge imaging, and simultaneous multi-contrast agent imaging.

Details

Verlag Springer International Publishing
Ersterscheinung 23. Januar 2025
Maße 23.5 cm x 15.5 cm
Gewicht 574 Gramm
Format Hardcover
ISBN-13 9783031756528
Seiten 261

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