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Critical Phenomena at Surfaces and Interfaces

Critical Phenomena at Surfaces and Interfaces

von Helmut Dosch
Softcover - 9783662149751
53,49 €
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Beschreibung

This book deals with the application of grazing angle x-ray and neutron scattering to the study of surface-induced critical phenomena. With the advent of even more advanced synchrotron radiation sources and new sophisticated instrumentation this novel technique is expected to experience a boom. The comprehensive and detailed presentation of theoretical and experimental aspects of the scattering of evanascent x-ray and neutron waves inside a solid makes this book particularly useful for tutorial courses. Particular emphasis is put on the use of this technique to extract microscopic information (correlation functions) from the real structure of a surface, from buried and magnetic interfaces and from surface roughness.

Evanescent X-Ray and Neutron Scattering

Details

Verlag Springer Berlin
Ersterscheinung 03. Oktober 2013
Maße 23.5 cm x 15.5 cm
Gewicht 254 Gramm
Format Softcover
ISBN-13 9783662149751
Seiten 149

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