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Beschreibung
The book describes RHEED (reflection high-energy electron diffraction) used as a tool for crystal growth. New methods using RHEED to characterize surfaces and interfaces during crystal growth by MBE (molecular beam epitaxy) are presented. Special emphasis is put on RHEED intensity oscillations, segregation phenomena, electron energy-loss spectroscopy and RHEED with rotating substrates.
Reflection High-Energy Electron Diffraction During Crystal Growth
Details
| Verlag | Springer Berlin |
| Ersterscheinung | 20. November 2013 |
| Maße | 23.5 cm x 15.5 cm |
| Gewicht | 367 Gramm |
| Format | Softcover |
| ISBN-13 | 9783662156148 |
| Auflage | Softcover reprint of the original 1st ed. 1999 |
| Seiten | 220 |
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