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Advanced Test Methods for SRAMs

Advanced Test Methods for SRAMs

von Alberto Bosio, Arnaud Virazel, Luigi Dilillo, Patrick Girard und Serge Pravossoudovitch
Softcover - 9781489983145
109,99 €
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Beschreibung

Modern electronics depend on nanoscaled technologies that present new challenges in terms of testing and diagnostics. Memories are particularly prone to defects since they exploit the technology limits to get the highest density. This book is an invaluable guide to the testing and diagnostics of the latest generation of SRAM, one of the most widely applied types of memory. Classical methods for testing memory are designed to handle the so-called "static faults," but these test solutions are not sufficient for faults that are emerging in the latest Very Deep Sub-Micron (VDSM) technologies. These new fault models, referred to as "dynamic faults", are not covered by classical test solutions and require the dedicated test sequences presented in this book.

Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies

Details

Verlag Springer US
Ersterscheinung 03. September 2014
Maße 23.5 cm x 15.5 cm
Gewicht 295 Gramm
Format Softcover
ISBN-13 9781489983145
Seiten 171

Schlagwörter

Computer-Aided Design (CAD), Computer-Aided Engineering (CAD - CAE) and Design, Electronic Circuits and Systems, Schaltkreise und Komponenten (Bauteile)

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