{"product_id":"scanning-electron-microscopy-and-x-ray-microanalysis-third-edition-von-patrick-echlin-joseph-goldstein-david-c-joy-eric-lifshin-charles-e-lyman-j-r-michael-dale-e-newbury-linda-sawyer","title":"Scanning Electron Microscopy and X-Ray Microanalysis","description":"In the decade since the publication of the second edition of Scanning Electron Microscopy and X-Ray Microanalysis, there has been a great expansion in the capabilities of the basic scanning electron microscope (SEM) and the x-ray spectrometers. The emergence of the variab- pressure\/environmental SEM has enabled the observation of samples c- taining water or other liquids or vapor and has allowed for an entirely new class of dynamic experiments, that of direct observation of che- cal reactions in situ. Critical advances in electron detector technology and computer-aided analysis have enabled structural (crystallographic) analysis of specimens at the micrometer scale through electron backscatter diffr- tion (EBSD). Low-voltage operation below 5 kV has improved x-ray spatial resolution by more than an order of magnitude and provided an effective route to minimizing sample charging. High-resolution imaging has cont- ued to develop with a more thorough understanding of how secondary el- trons are generated. The ?eld emission gun SEM, with its high brightness, advanced electron optics, which minimizes lens aberrations to yield an - fective nanometer-scale beam, and “through-the-lens” detector to enhance the measurement of primary-beam-excited secondary electrons, has made high-resolution imaging the rule rather than the exception. Methods of x-ray analysis have evolved allowing for better measurement of specimens with complex morphology: multiple thin layers of different compositions, and rough specimens and particles. Digital mapping has transformed classic x-ray area scanning, a purely qualitative technique, into fully quantitative compositional mapping.\u003cdiv class=\"aw-variant-hidden-subtitle-div\" id=\"aw-variant-subtitle-9781461349693\"\u003e\u003ch3\u003eThird Edition\u003c\/h3\u003e\u003c\/div\u003e","brand":"Libri","offers":[{"title":"Softcover - 9781461349693","offer_id":39414977790045,"sku":"9781461349693","price":117.69,"currency_code":"EUR","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0940\/0622\/files\/3441569d-a63b-45cf-8ee9-f3a051ec4b51.jpg?v=1775709123","url":"https:\/\/shop.autorenwelt.de\/products\/scanning-electron-microscopy-and-x-ray-microanalysis-third-edition-von-patrick-echlin-joseph-goldstein-david-c-joy-eric-lifshin-charles-e-lyman-j-r-michael-dale-e-newbury-linda-sawyer","provider":"Autorenwelt Shop","version":"1.0","type":"link"}