{"product_id":"retroreflex-ellipsometry-for-nonplanar-surfaces-von-chia-wei-chen","title":"Retroreflex Ellipsometry for Nonplanar Surfaces","description":"Retroreflex ellipsometry addresses the geometric restrictions of conventional ellipsometry by using a retroreflective sheet, which returns the light beam from the sample on the same beam path. Simulation and experiments of retroreflex ellipsometry in two- and three-phase systems have been demonstrated based on the proposed concepts, which have shown the capabilities of ellipsometric measurements on nonplanar surfaces.\u003cdiv class=\"aw-variant-hidden-subtitle-div\" id=\"aw-variant-subtitle-9783731514022\"\u003e\u003ch3\u003e\u003c\/h3\u003e\u003c\/div\u003e","brand":"Autorenwelt Shop","offers":[{"title":"Softcover - 9783731514022","offer_id":54659140059461,"sku":"9783731514022","price":42.0,"currency_code":"EUR","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0940\/0622\/files\/98e3fb3f-76d9-41a7-84ce-2b0e82182f80.jpg?v=1780378761","url":"https:\/\/shop.autorenwelt.de\/products\/retroreflex-ellipsometry-for-nonplanar-surfaces-von-chia-wei-chen","provider":"Autorenwelt Shop","version":"1.0","type":"link"}