{"product_id":"power-constrained-testing-of-vlsi-circuits-a-guide-to-the-ieee-1149-4-test-standard-von-bashir-m-al-hashimi-nicola-nicolici","title":"Power-Constrained Testing of VLSI Circuits","description":"\n                \u003cp\u003eThis text focuses on techniques for minimizing power dissipation during test application at logic and register-transfer levels of abstraction of the VLSI design flow. It surveys existing techniques and presents several test automation techniques for reducing power in scan-based sequential circuits and BIST data paths. \u003c\/p\u003e\n            \u003cdiv class=\"aw-variant-hidden-subtitle-div\" id=\"aw-variant-subtitle-9781402072352\"\u003e\u003ch3\u003eA Guide to the IEEE 1149.4 Test Standard\u003c\/h3\u003e\u003c\/div\u003e\u003cdiv class=\"aw-variant-hidden-subtitle-div\" id=\"aw-variant-subtitle-9781441953155\"\u003e\u003ch3\u003eA Guide to the IEEE 1149.4 Test Standard\u003c\/h3\u003e\u003c\/div\u003e","brand":"Libri","offers":[{"title":"Hardcover - 9781402072352","offer_id":50828934726,"sku":"9781402072352","price":106.99,"currency_code":"EUR","in_stock":true},{"title":"Softcover - 9781441953155","offer_id":39416611700829,"sku":"9781441953155","price":106.99,"currency_code":"EUR","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0940\/0622\/files\/bdcc4b17-3312-4c96-be25-f81f1c4fe498.jpg?v=1746677491","url":"https:\/\/shop.autorenwelt.de\/products\/power-constrained-testing-of-vlsi-circuits-a-guide-to-the-ieee-1149-4-test-standard-von-bashir-m-al-hashimi-nicola-nicolici","provider":"Autorenwelt Shop","version":"1.0","type":"link"}