{"product_id":"near-field-characterization-of-photonic-nanodevices-von-maxim-abashin","title":"Near-field Characterization of Photonic Nanodevices","description":"\u003cp\u003eThe increasing density of data transmission, speed  of all-optical signal processing, and demand for  higher resolution microscopy and spectroscopy  stimulate the development of the nanophotonics. Near- field microscopy is not limited by light diffraction  and thus it can achieve sufficiently subwavelength  resolution. Therefore this approach is perfect for  nanophotonic device characterization. Heterodyne  detection allows resolution of the optical phase and  improves signal-to-noise performance in near-field  microscopy. The book describes a Heterodyne Near- field Scanning Optical Microscope (HNSOM) and  applications of this approach to characterization of  several classes of the photonic nanodevices.\u003c\/p\u003e\u003cdiv class=\"aw-variant-hidden-subtitle-div\" id=\"aw-variant-subtitle-9783838307114\"\u003e\u003ch3\u003eNear-field Scanning Optical Microscopy (NSOM)  characterization of photonic nanodevices and  nanoscale optical phenomena\u003c\/h3\u003e\u003c\/div\u003e","brand":"Autorenwelt Shop","offers":[{"title":"Softcover - 9783838307114","offer_id":39497095512157,"sku":"9783838307114","price":49.0,"currency_code":"EUR","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0940\/0622\/files\/c7877758-f3a6-48a9-8b26-7f4693df00e0.jpg?v=1769666770","url":"https:\/\/shop.autorenwelt.de\/products\/near-field-characterization-of-photonic-nanodevices-von-maxim-abashin","provider":"Autorenwelt Shop","version":"1.0","type":"link"}