{"product_id":"lock-in-thermography-basics-and-use-for-evaluating-electronic-devices-and-materials-von-otwin-breitenstein-martin-c-schubert-wilhelm-warta","title":"Lock-in Thermography","description":"\n                                \n                \u003cp\u003e\u003c\/p\u003e\n                                \n                \u003cp\u003eThis book discusses lock-in thermography (LIT) as a dynamic variant of the widely known IR thermography. It focuses on applications to electronic devices and materials, but also includes chapters addressing non-destructive evaluation. Periodically modulating heat sources allows a much-improved signal-to-noise ratio (up to 1000x) and a far better lateral resolution compared to steady-state thermography. Reviewing various experimental approaches to LIT, particularly the commercial LIT systems available, this 3rd edition introduces new LIT applications, such as illuminated LIT applied to solar cells, non-thermal LIT lifetime mapping and LIT application to spin caloritronics problems. Numerous LIT investigation case studies are also included.\u003c\/p\u003e\n                                \n                \u003cbr\u003e\n                                \n                \u003cp\u003e\u003c\/p\u003e\n                            \n            \u003cdiv class=\"aw-variant-hidden-subtitle-div\" id=\"aw-variant-subtitle-9783319998244\"\u003e\u003ch3\u003eBasics and Use for Evaluating Electronic Devices and Materials\u003c\/h3\u003e\u003c\/div\u003e","brand":"Libri","offers":[{"title":"Hardcover - 9783319998244","offer_id":39342412365917,"sku":"9783319998244","price":171.19,"currency_code":"EUR","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0940\/0622\/files\/7ebcc775-c117-4550-a12c-58f7aea307a0.jpg?v=1778045071","url":"https:\/\/shop.autorenwelt.de\/products\/lock-in-thermography-basics-and-use-for-evaluating-electronic-devices-and-materials-von-otwin-breitenstein-martin-c-schubert-wilhelm-warta","provider":"Autorenwelt Shop","version":"1.0","type":"link"}