Investigations at Metal/Si Surfaces and Interfaces: Study of Structural, Morphological, Magnetic and Electrical Behaviour

Investigations at Metal/Si Surfaces and Interfaces: Study of Structural, Morphological, Magnetic and Electrical Behaviour


59,00 €
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von Shivani Agarwal, I. P. Jain

Beschreibung

The interaction of semiconductor surfaces with deposited metals is very important for understanding many aspects of the behavior of microelectronic devices. The early stages of metal-semiconductor interface formation are amenable to analysis with surface sensitive techniques. The most important characteristic of metal semiconductor interface is nature of the potential barrier between the Fermi level in the metal and the majority carrier band edge of semiconductor of that interface. The study of metal / semiconductor (Si) reactions are of great importance present in every semiconductor device.The present book is an outcome of investigations of structural, morphological, magnetic and electrical behaviour of metal (Co, Cr, Ni) / semiconductor (Si) system.


Tags: Physik, Astronomie, Sonstiges


Taschenbuch - 9783847339328
Verlag: LAP Lambert Academic Publishing
Ersterscheinung: April 2012
ISBN-13: 9783847339328
Größe: 220 mm x 150 mm x 8 mm
Gewicht: 219 Gramm
136 Seiten
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