{"product_id":"handbook-of-materials-testing-reactors-and-associated-hot-laboratories-in-the-european-community-nuclear-science-and-technology-von-peter-von-der-hardt-heinz-rottger-hrsg","title":"Handbook of Materials Testing Reactors and Associated Hot Laboratories in the European Community","description":"\u003cp\u003eEstimating Device Reliability: Assessment of Credibility  is concerned with the plausibility of reliability estimates obtained  from statistical models. Statistical predictions are necessary because  technology is always pushing into unexplored areas faster than devices  can be made long-lived by design. Flawed reliability methodologies can  produce disastrous results, an outstanding example of which is the  catastrophic failure of the manned space shuttle CHALLENGER in January  1986. This issue is not whether, but which, statistical models should  be used. The issue is not making reliability estimates, but is instead  their credibility. The credibility questions explored in the context  of practical applications include:    What does the  confidence level associated with the use of statistical model mean?       Is the numerical result associated with a high confidence level  beyond dispute?      When is it appropriate to use the exponential  (constant hazard rate) model? Does this model always provide the most  conservative reliability estimate?      Are the results of  traditional 'random' failure hazard rate calculations tenable? Are  there persuasive alternatives?      What model should be used to  describe the useful life of a device when wearout is absent?       When Weibull and lognormal failure plots containing a large number of  failure times appear similar, how should the correct wearout model be  selected?       Is it important to distinguish between a  conservative upper bound on a probability of failure and a realistic  estimate of the same probability?        Estimating Device  Reliability: Assessment of Credibility is for those who are obliged  to make reliability calculations with a paucity of somewhat corrupt  data, by using inexact models, and by making physical assumptions  which are impractical to verify. Illustrative examples deal with a  variety of electronic devices, ICs and lasers.\u003cbr\u003e\u003c\/p\u003e\u003cdiv class=\"aw-variant-hidden-subtitle-div\" id=\"aw-variant-subtitle-9789027713476\"\u003e\u003ch3\u003eNuclear Science and Technology\u003c\/h3\u003e\u003c\/div\u003e","brand":"Libri","offers":[{"title":"Hardcover - 9789027713476","offer_id":51298505350,"sku":"9789027713476","price":106.99,"currency_code":"EUR","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0940\/0622\/files\/ccb7bc8a-6822-450e-83ca-4fada0e1ba63.jpg?v=1782019367","url":"https:\/\/shop.autorenwelt.de\/products\/handbook-of-materials-testing-reactors-and-associated-hot-laboratories-in-the-european-community-nuclear-science-and-technology-von-peter-von-der-hardt-heinz-rottger-hrsg","provider":"Autorenwelt Shop","version":"1.0","type":"link"}