{"product_id":"failure-analysis-of-integrated-circuits-tools-and-techniques-von-lawrence-c-wagner-hrsg","title":"Failure Analysis of Integrated Circuits","description":"\n                                \n                \u003cem\u003eFailure Analysis of Integrated Circuits: Tools and  Techniques\u003c\/em\u003e\n                                 provides a basic understanding of how the most commonly  used tools and techniques in silicon-based semiconductors are applied  to understanding the root cause of electrical failures in integrated  circuits. These include applications specific to performing failure  analysis such as decapsulation, deprocessing, and fail site isolation,  as well as physical and chemical analysis tools and techniques. The  coverage is qualitative, and it provides a general understanding for  making intelligent tool choices. Also included is coverage of the  shortcomings, limitations, and strengths of each technique. \n                \n                \u003cbr\u003e\n                                  \n                \n                \u003cem\u003eFailure Analysis of Integrated Circuits: Tools and Techniques\u003c\/em\u003e\n                                 is  a `must have' reference work for semiconductor professionals and  researchers.\n            \n            \u003cdiv class=\"aw-variant-hidden-subtitle-div\" id=\"aw-variant-subtitle-9780412145612\"\u003e\u003ch3\u003eTools and Techniques\u003c\/h3\u003e\u003c\/div\u003e\u003cdiv class=\"aw-variant-hidden-subtitle-div\" id=\"aw-variant-subtitle-9781461372318\"\u003e\u003ch3\u003eTools and Techniques\u003c\/h3\u003e\u003c\/div\u003e","brand":"Libri","offers":[{"title":"Hardcover - 9780412145612","offer_id":51485034246,"sku":"9780412145612","price":160.49,"currency_code":"EUR","in_stock":true},{"title":"Softcover - 9781461372318","offer_id":39414821683293,"sku":"9781461372318","price":160.49,"currency_code":"EUR","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0940\/0622\/files\/cfaf78ed-e6d9-44a9-b7aa-6fa1784247b7.jpg?v=1774757273","url":"https:\/\/shop.autorenwelt.de\/products\/failure-analysis-of-integrated-circuits-tools-and-techniques-von-lawrence-c-wagner-hrsg","provider":"Autorenwelt Shop","version":"1.0","type":"link"}