{"product_id":"design-analysis-and-test-of-logic-circuits-under-uncertainty-von-john-p-hayes-smita-krishnaswamy-igor-l-markov","title":"Design, Analysis and Test of Logic Circuits Under Uncertainty","description":"Logic circuits are becoming increasingly susceptible to probabilistic behavior caused by external radiation and process variation. In addition, inherently probabilistic quantum- and nano-technologies are on the horizon as we approach the limits of CMOS scaling. Ensuring the reliability of such circuits despite the probabilistic behavior is a key challenge in IC design---one that necessitates a fundamental, probabilistic reformulation of synthesis and testing techniques. This monograph will present techniques for analyzing, designing, and testing logic circuits with probabilistic behavior.\u003cdiv class=\"aw-variant-hidden-subtitle-div\" id=\"aw-variant-subtitle-9789048196432\"\u003e\u003ch3\u003e\u003c\/h3\u003e\u003c\/div\u003e\u003cdiv class=\"aw-variant-hidden-subtitle-div\" id=\"aw-variant-subtitle-9789400797987\"\u003e\u003ch3\u003e\u003c\/h3\u003e\u003c\/div\u003e","brand":"Libri","offers":[{"title":"Hardcover - 9789048196432","offer_id":40567706878045,"sku":"9789048196432","price":106.99,"currency_code":"EUR","in_stock":true},{"title":"Softcover - 9789400797987","offer_id":39462672171101,"sku":"9789400797987","price":106.99,"currency_code":"EUR","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0940\/0622\/files\/10c5af32-25a1-4183-9874-410b95c2d52d.jpg?v=1772089394","url":"https:\/\/shop.autorenwelt.de\/products\/design-analysis-and-test-of-logic-circuits-under-uncertainty-von-john-p-hayes-smita-krishnaswamy-igor-l-markov","provider":"Autorenwelt Shop","version":"1.0","type":"link"}