{"product_id":"debug-automation-from-pre-silicon-to-post-silicon-von-mehdi-dehbashi-gorschwin-fey","title":"Debug Automation from Pre-Silicon to Post-Silicon","description":"\n                                \n                \u003cp\u003eThis book describes automated debugging approaches for the bugs and the faults which appear in different abstraction levels of a hardware system. The authors employ a transaction-based debug approach to systems at the transaction-level, asserting the correct relation of transactions. The automated debug approach for design bugs finds the potential fault candidates at RTL and gate-level of a circuit. Debug techniques for logic bugs and synchronization bugs are demonstrated, enabling readers to localize the most difficult bugs. Debug automation for electrical faults (delay faults)finds the potentially failing speedpaths in a circuit at gate-level. The various debug approaches described achieve high diagnosis accuracy and reduce the debugging time, shortening the IC development cycle and increasing the productivity of designers.\u003c\/p\u003e\n                                \n                \u003cul\u003e\n                                        \n                    \u003cli\u003eDescribes a unified framework for debug automation used at both pre-silicon and post-silicon stages;\u003c\/li\u003e\n                                        \n                    \u003cli\u003eProvides approaches for debug automation of a hardware system at different levels of abstraction, i.e., chip, gate-level, RTL and transaction level;\u003c\/li\u003e\n                                        \n                    \u003cli\u003eIncludes techniques for debug automation of design bugs and electrical faults, as well as an infrastructure to debug NoC-based multiprocessor SoCs. \u003c\/li\u003e\n                                    \n                \u003c\/ul\u003e\n                            \n            \u003cdiv class=\"aw-variant-hidden-subtitle-div\" id=\"aw-variant-subtitle-9783319356105\"\u003e\u003ch3\u003e\u003c\/h3\u003e\u003c\/div\u003e\u003cdiv class=\"aw-variant-hidden-subtitle-div\" id=\"aw-variant-subtitle-9783319093086\"\u003e\u003ch3\u003e\u003c\/h3\u003e\u003c\/div\u003e","brand":"Libri","offers":[{"title":"Softcover - 9783319356105","offer_id":39632584310877,"sku":"9783319356105","price":53.49,"currency_code":"EUR","in_stock":true},{"title":"Hardcover - 9783319093086","offer_id":40590520057949,"sku":"9783319093086","price":53.49,"currency_code":"EUR","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0940\/0622\/files\/f45eca53-4334-42b4-bbbc-cbc4594f7e99.jpg?v=1775191488","url":"https:\/\/shop.autorenwelt.de\/products\/debug-automation-from-pre-silicon-to-post-silicon-von-mehdi-dehbashi-gorschwin-fey","provider":"Autorenwelt Shop","version":"1.0","type":"link"}