{"product_id":"built-in-self-test-of-global-routing-resources-in-fpgas-von-jia-yao","title":"BUILT-IN SELF-TEST OF GLOBAL ROUTING RESOURCES IN FPGAS","description":"\u003cp\u003eIt is important to test programmable routing  resources in Field Programmable Gate Arrays (FPGAs)  because they take up the largest portion of  configuration memory bits. In Virtex-4 FPGAs,  routing resources account for over 80% of the  configuration memory. Built-In Self-Test (BIST) is  adopted to test the routing resources in FPGAs and  overcomes issues residing in previously developed  test approaches. Analysis and evaluations of  developed BIST algorithm and configurations are  provided.\u003c\/p\u003e\u003cdiv class=\"aw-variant-hidden-subtitle-div\" id=\"aw-variant-subtitle-9783843374958\"\u003e\u003ch3\u003eBIST FOR XILINX VIRTEX-4 FPGAS\u003c\/h3\u003e\u003c\/div\u003e","brand":"Autorenwelt Shop","offers":[{"title":"Softcover - 9783843374958","offer_id":39497193816157,"sku":"9783843374958","price":49.0,"currency_code":"EUR","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0940\/0622\/files\/08b1c094-071f-4879-9904-5e5bcddf7a16.jpg?v=1763184448","url":"https:\/\/shop.autorenwelt.de\/products\/built-in-self-test-of-global-routing-resources-in-fpgas-von-jia-yao","provider":"Autorenwelt Shop","version":"1.0","type":"link"}