{"product_id":"atomic-force-microscopy-imaging-measuring-and-manipulating-surfaces-at-the-atomic-scale-von-victor-bellitto-hrsg","title":"Atomic Force Microscopy","description":"\u003cp\u003eWith the advent of the atomic force microscope (AFM) came an extremely valuable analytical resource and technique useful for the qualitative and quantitative surface analysis with sub-nanometer resolution. In addition, samples studied with an AFM do not require any special pretreatments that may alter or damage the sample and permits a three dimensional investigation of the surface. This book presents a collection of current research from scientists throughout the world that employ atomic force microscopy in their investigations. The technique has become widely accepted and used in obtaining valuable data in a wide variety of fields.  It is impressive to see how, in a short time period since its development in 1986, it has proliferated and found many uses throughout manufacturing, research and development.\u003c\/p\u003e\u003cdiv class=\"aw-variant-hidden-subtitle-div\" id=\"aw-variant-subtitle-9789535104148\"\u003e\u003ch3\u003eImaging, Measuring and Manipulating Surfaces at the Atomic Scale\u003c\/h3\u003e\u003c\/div\u003e","brand":"Libri","offers":[{"title":"Hardcover - 9789535104148","offer_id":27713291878493,"sku":"9789535104148","price":129.0,"currency_code":"EUR","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0940\/0622\/files\/0412567f-7b00-4f77-b32b-ca944389cf47.jpg?v=1747027010","url":"https:\/\/shop.autorenwelt.de\/products\/atomic-force-microscopy-imaging-measuring-and-manipulating-surfaces-at-the-atomic-scale-von-victor-bellitto-hrsg","provider":"Autorenwelt Shop","version":"1.0","type":"link"}