{"product_id":"apertureless-snom-von-alpan-bek","title":"Apertureless SNOM","description":"\u003cp\u003eIn this book a scanning near-field optical  microscope (SNOM) based on an apertureless  scattering technique is introduced for resolving  optical properties of surfaces with lateral  resolution reaching 10 nm and better. The  construction of the instrument is based on a dynamic  mode atomic force microscope (AFM) which is coupled  with a sophisticated heterodyne interferometric  optical detection system. A laser beam is focused  onto the apex of the metallic or dielectric AFM tip.  The backscattered light is collected and interfered  with a reference beam which is slightly shifted in  frequency with respect to the scattered beam. By  demodulating the beat signal at higher harmonics of  the tip vibration, the far field can be suppressed  effectively, leaving only the near-field information  of the surface-tip interaction. The amplitude and  phase of the near-field belonging to the surface is  obtained simultaneously with topography. The  apertureless SNOM (a-SNOM) features several  advantages over the well-known aperture SNOM: strong  background suppression, high sensitivity to material  contrast and a resolution limited essentially only  by the tip apex size.\u003c\/p\u003e\u003cdiv class=\"aw-variant-hidden-subtitle-div\" id=\"aw-variant-subtitle-9783843393997\"\u003e\u003ch3\u003eA New Tool for Nano-Optics\u003c\/h3\u003e\u003c\/div\u003e","brand":"Autorenwelt Shop","offers":[{"title":"Softcover - 9783843393997","offer_id":39470057914461,"sku":"9783843393997","price":49.0,"currency_code":"EUR","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0940\/0622\/files\/b41b417f-c4b8-4944-b8ba-aa0ab4a06677.jpg?v=1773297476","url":"https:\/\/shop.autorenwelt.de\/products\/apertureless-snom-von-alpan-bek","provider":"Autorenwelt Shop","version":"1.0","type":"link"}