{"product_id":"an-improved-markov-random-field-design-approach-for-digital-circuits-von-jahanzeb-anwer-nor-hisham-bin-hamid-und-vijanth-sagayan-asirvadam","title":"An Improved Markov Random Field Design Approach For Digital Circuits","description":"\u003cp\u003eAs the MOSFET dimensions scale down to nanoscale  level, the reliability of circuits based on these  devices decreases. Therefore, a mechanism has to be  devised that can make the nanoscale systems perform  reliably using unreliable circuit components. The  solution is fault-tolerant circuit design. Markov  Random Field (MRF) is an effective approach that  achieves fault-tolerance in integrated circuit  design. The previous research on this technique  suffers from limitations at the design, simulation  and implementation levels. As improvements, the MRF  fault-tolerance rules have been validated for a  practical circuit example. The simulation framework  is extended from thermal to a combination of thermal  and random telegraph signal noise sources to  provide a more rigorous noise environment for the  simulation of nanoscale circuits. Moreover, an  architecture-level improvement has been proposed in  the design of previous MRF gates. The re-designed MRF  is termed as Improved-MRF. By simulating various test  circuits in Cadence, it is found that Improved-MRF  circuits are 400 whereas MRF circuits are only 10  times more noise-tolerant than the CMOS alternatives.\u003c\/p\u003e\u003cdiv class=\"aw-variant-hidden-subtitle-div\" id=\"aw-variant-subtitle-9783844332636\"\u003e\u003ch3\u003eIntroducing Fault-Tolerance With Higher Noise-Immunity For The Nano-Circuits As Compared To CMOS And  MRF Designs\u003c\/h3\u003e\u003c\/div\u003e","brand":"Autorenwelt Shop","offers":[{"title":"Softcover - 9783844332636","offer_id":39495929266269,"sku":"9783844332636","price":49.0,"currency_code":"EUR","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0940\/0622\/files\/700f6861-4443-4ea3-b3c6-02c4179da77f.jpg?v=1757742469","url":"https:\/\/shop.autorenwelt.de\/products\/an-improved-markov-random-field-design-approach-for-digital-circuits-von-jahanzeb-anwer-nor-hisham-bin-hamid-und-vijanth-sagayan-asirvadam","provider":"Autorenwelt Shop","version":"1.0","type":"link"}