{"product_id":"advances-in-x-ray-analysis-von-m-amara-c-s-barrett-nick-bernard-ting-c-huang-dietrich-knorr-hrsg","title":"Advances in X-Ray Analysis","description":"The 39th Annual Denver X-Ray Conference on Applications of X-Ray Analysis was held July 30 -August 3, 1990, at the Sheraton Steamboat Resort and Conference Center, Steamboat Springs, Colorado. The \"Denver Conference\" is recognized to be a major event in the x-ray analysis field, bringing together scientists and engineers from around the world to discuss the state of the art in x-ray applications as well as indications for future develop ments. In recent years there has been a steady expansion of applications of x-ray analysis to characterize surfaces and thin films. To introduce the audience to one of the exciting and important new developments in x-ray fluorescence, the topic for the Plenary Session of the 1990 Conference was: \"Surface and Near-Surface X-Ray Spectroscopy. \" The Conference had the privilege of inviting five leading world experts in the field of x-ray spectroscopy to deliver lectures at the Plenary Session. The first two lectures were on total-reflection x-ray fluorescence spectrometry. Professor P. Wobrauschek of Austria reviewed \"Recent Developments and Results in Total-Reflection X-Ray Fluorescence. \" Trends and applications of the technique were also discussed. Dr. T. Arai of Japan reported on \"Surface and Near-Surface Analysis of Silicon Wafers by Total Reflection X-Ray Fluorescence. \" He emphasized the importance of using proper x-ray optics to achieve high signal-to-noise ratios. A mathematical model relating the x-ray intensity to the depth of x-ray penetration was also described.\u003cdiv class=\"aw-variant-hidden-subtitle-div\" id=\"aw-variant-subtitle-9781461366676\"\u003e\u003ch3\u003e\u003c\/h3\u003e\u003c\/div\u003e","brand":"Libri","offers":[{"title":"Softcover - 9781461366676","offer_id":39414922412125,"sku":"9781461366676","price":53.49,"currency_code":"EUR","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0940\/0622\/files\/1daf70e7-3b0a-4991-a6ec-cbdb3247c59c.jpg?v=1779163325","url":"https:\/\/shop.autorenwelt.de\/products\/advances-in-x-ray-analysis-von-m-amara-c-s-barrett-nick-bernard-ting-c-huang-dietrich-knorr-hrsg","provider":"Autorenwelt Shop","version":"1.0","type":"link"}