{"product_id":"vlsi-design-and-test-21st-international-symposium-vdat-2017-roorkee-india-june-29-july-2-2017-revised-selected-papers-von-brajesh-kumar-kaushik-sudeb-dasgupta-virendra-singh-hrsg","title":"VLSI Design and Test","description":"\n                                \n                \u003cp\u003e\n                                        This book constitutes the refereed proceedings of the 21st International Symposium on VLSI Design and Test, VDAT 2017, held in Roorkee, India, in June\/July 2017.\n                    \n                    \u003cbr\u003e\n                                         The 48 full papers presented together with 27 short papers were carefully reviewed and selected from 246 submissions. The papers were organized in topical sections named: digital design; analog\/mixed signal; VLSI testing; devices and technology; VLSI architectures; emerging technologies and memory; system design; low power design and test; RF circuits; architecture and CAD; and design verification.\n                    \n                    \u003cb\u003e\u003c\/b\u003e\n                                    \n                \u003c\/p\u003e\n                            \n            \u003cdiv class=\"aw-variant-hidden-subtitle-div\" id=\"aw-variant-subtitle-9789811074691\"\u003e\u003ch3\u003e21st International Symposium, VDAT 2017, Roorkee, India, June 29 – July 2, 2017, Revised Selected Papers\u003c\/h3\u003e\u003c\/div\u003e","brand":"Libri","offers":[{"title":"Softcover - 9789811074691","offer_id":39454845304925,"sku":"9789811074691","price":106.99,"currency_code":"EUR","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0940\/0622\/files\/e9eed90c-ac03-4adc-ae3a-fbc5d437e642.jpg?v=1778053829","url":"https:\/\/shop.autorenwelt.de\/en\/products\/vlsi-design-and-test-21st-international-symposium-vdat-2017-roorkee-india-june-29-july-2-2017-revised-selected-papers-von-brajesh-kumar-kaushik-sudeb-dasgupta-virendra-singh-hrsg","provider":"Autorenwelt Shop","version":"1.0","type":"link"}