{"product_id":"testing-sequence-dependent-defects-new-methods-of-applying-two-pattern-tests-and-testing-sequence-dependent-defects-von-narendra-devta-prasanna","title":"Testing Sequence Dependent Defects","description":"\u003cp\u003eWith new technologies that continue to shrink the feature size of integrated circuits into deep sub-micron domain, there is an increasingly higher incidence of sequence dependent defects during manufacturing. Two-pattern tests are therefore being used in manufacturing testing to supplement the traditional method of single pattern tests based on the stuck-at fault model. In this work we present methods of generating and applying two-pattern test sets to enable high quality and cost effective testing of sequence dependent defects such as transition delay faults, transistor stuck-open faults etc.\u003c\/p\u003e\u003cdiv class=\"aw-variant-hidden-subtitle-div\" id=\"aw-variant-subtitle-9783838312194\"\u003e\u003ch3\u003eNew Methods of Applying Two-pattern Tests and Testing Sequence Dependent Defects\u003c\/h3\u003e\u003c\/div\u003e","brand":"Libri","offers":[{"title":"Softcover - 9783838312194","offer_id":39447331504221,"sku":"9783838312194","price":49.0,"currency_code":"EUR","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0940\/0622\/files\/6575391e-0685-4303-8324-7adb35465b4d.jpg?v=1769493951","url":"https:\/\/shop.autorenwelt.de\/en\/products\/testing-sequence-dependent-defects-new-methods-of-applying-two-pattern-tests-and-testing-sequence-dependent-defects-von-narendra-devta-prasanna","provider":"Autorenwelt Shop","version":"1.0","type":"link"}