{"product_id":"testing-of-interposer-based-2-5d-integrated-circuits-von-ran-wang-krishnendu-chakrabarty","title":"Testing of Interposer-Based 2.5D Integrated Circuits","description":"\n                                \n                \u003cp\u003eThis book provides readers with an insightful guide to the design, testing and optimization of 2.5D integrated circuits.  The authors describe a set of design-for-test methods to address various challenges posed by the new generation of 2.5D ICs, including pre-bond testing of the silicon interposer, at-speed interconnect testing, built-in self-test architecture, extest scheduling, and a programmable method for low-power scan shift in SoC dies.  This book covers many testing techniques that have already been used in mainstream semiconductor companies. Readers will benefit from an in-depth look at test-technology solutions that are needed to make 2.5D ICs a reality and commercially viable.\u003c\/p\u003e\n                            \n            \u003cdiv class=\"aw-variant-hidden-subtitle-div\" id=\"aw-variant-subtitle-9783319854618\"\u003e\u003ch3\u003e\u003c\/h3\u003e\u003c\/div\u003e\u003cdiv class=\"aw-variant-hidden-subtitle-div\" id=\"aw-variant-subtitle-9783319547138\"\u003e\u003ch3\u003e\u003c\/h3\u003e\u003c\/div\u003e","brand":"Libri","offers":[{"title":"Softcover - 9783319854618","offer_id":39426505441373,"sku":"9783319854618","price":117.69,"currency_code":"EUR","in_stock":true},{"title":"Hardcover - 9783319547138","offer_id":28578820653149,"sku":"9783319547138","price":106.99,"currency_code":"EUR","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0940\/0622\/files\/3f091c1d-b666-4857-a319-bebf9c04e5ee.jpg?v=1779856102","url":"https:\/\/shop.autorenwelt.de\/en\/products\/testing-of-interposer-based-2-5d-integrated-circuits-von-ran-wang-krishnendu-chakrabarty","provider":"Autorenwelt Shop","version":"1.0","type":"link"}