{"product_id":"an-introduction-to-logic-circuit-testing-von-parag-k-lala","title":"An Introduction to Logic Circuit Testing","description":"An Introduction to Logic Circuit Testing provides a detailed coverage of techniques for test generation and testable design of digital electronic circuits\/systems. The material covered in the book should be sufficient for a course, or part of a course, in digital circuit testing for senior-level undergraduate and first-year graduate students in Electrical Engineering and Computer Science. The book will also be a valuable resource for engineers working in the industry. This book has four chapters. Chapter 1 deals with various types of faults that may occur in very large scale integration (VLSI)-based digital circuits. Chapter 2 introduces the major concepts of all test generation techniques such as redundancy, fault coverage, sensitization, and backtracking. Chapter 3 introduces the key concepts of testability, followed by some ad hoc design-for-testability rules that can be used to enhance testability of combinational circuits. Chapter 4 deals with test generation and response evaluation techniques used in BIST (built-in self-test) schemes for VLSI chips.\n\nTable of Contents: Introduction \/ Fault Detection in Logic Circuits \/ Design for Testability \/ Built-in Self-Test \/ References\u003cdiv class=\"aw-variant-hidden-subtitle-div\" id=\"aw-variant-subtitle-9783031797842\"\u003e\u003ch3\u003e\u003c\/h3\u003e\u003c\/div\u003e","brand":"Autorenwelt Shop","offers":[{"title":"Softcover - 9783031797842","offer_id":40181279916125,"sku":"9783031797842","price":29.95,"currency_code":"EUR","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0940\/0622\/files\/20e614b7-f266-4501-b419-a661b67a4eb1.jpg?v=1775105323","url":"https:\/\/shop.autorenwelt.de\/en\/products\/an-introduction-to-logic-circuit-testing-von-parag-k-lala","provider":"Autorenwelt Shop","version":"1.0","type":"link"}