{"product_id":"a-novel-approach-for-fault-tolerant-nano-memory-applications-von-chinnala-pavan-kumar","title":"A Novel approach for Fault Tolerant Nano Memory Applications","description":"\u003cp\u003eNANOTECHNOLOGY provides smaller, faster, and lower energy devices which allow more powerful and compact circuitry; However, these benefits come with a cost¿the nanoscale devices may be less reliable. Thermal- and shot-noise estimations alone suggest that the transient fault rate of an individual nanoscale device (e.g., transistor or nanowire) may be orders of magnitude higher than today¿s devices. A failure is said to have occurred in a circuit or system if it deviates from its specified behavior. A fault on the other hand is physical defect which may or may not cause a failure. The failure rate, also known as the hazard rate and defined as number of failures per unit time compared with the number of surviving components. A fault is characterized by its nature, value, extent \u0026amp; duration.\u003c\/p\u003e\u003cdiv class=\"aw-variant-hidden-subtitle-div\" id=\"aw-variant-subtitle-9783659894411\"\u003e\u003ch3\u003e\u003c\/h3\u003e\u003c\/div\u003e","brand":"Libri","offers":[{"title":"Softcover - 9783659894411","offer_id":39434604118109,"sku":"9783659894411","price":35.9,"currency_code":"EUR","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0940\/0622\/files\/2f239abf-e7b1-4cf6-a575-9c7542b8cd9c.jpg?v=1770184710","url":"https:\/\/shop.autorenwelt.de\/en\/products\/a-novel-approach-for-fault-tolerant-nano-memory-applications-von-chinnala-pavan-kumar","provider":"Autorenwelt Shop","version":"1.0","type":"link"}